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TICST 2017

TICST 2017

TICST (The International Conference on Science and Technology) is a multi-disciplinary scientific conference held once every two years and jointly organized by universities from Thailand, Taiwan, Indonesia and Japan. The goal of the conference is to promote scientific...
64th AVS International Symposium & Exhibition 2017

64th AVS International Symposium & Exhibition 2017

Hiden Analytical recently exhibited at the 64th AVS International Symposium & Exhibition 2017 in Tampa, FL. The American Vacuum Society (AVS) show displayed cutting edge technology in the field of vacuum sciences. Manufactures display tools focusing on thin film...
RAFT 2017

RAFT 2017

Hiden Analytical recently exhibited at the RAFT 2017 (Recent Advances in Fermentation Technology) meeting in Bonita Springs, FL. Bringing together the world’s leading researchers from both industry and academia, this biennial meeting focuses on the latest advances in...
Characterisation and Quality Control of MBE Processes

Characterisation and Quality Control of MBE Processes

Hiden Analytical present a family of quadrupole mass spectrometer-based diagnostic instruments with specific application to the molecular beam epitaxy process and to post-process thin film evaluation, with primary features highlighted in their new MBE process-specific...